| Scanning Electron Microscopy (SEM) | Morphology up to 1 nm resolution, elemental mapping down to a few µm thick |
| Nano X-ray Tomography (CT) | Morphology of defects or phases based on X-ray density differences (non-destructive) |
| Focus Ion Beam (FIB) | Site specific sample preparation for SEM and TEM, crystal orientation |
| Transmission Electron Microscopy (TEM) | Morphology and elemental mapping up to atomic scale resolution |
| X-ray Diffraction (XRD) | Crystal structure, material identification, phase diagram of solids and thin films |
| X-ray Photoelectron Spectroscopy (XPS) | Elemental concentration, chemical state and bonding from 2-3 nm uppermost surface of solid materials |
| Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) | Elemental and molecular mass spectra and chemical mapping from 2-3 nm uppermost surface; elemental depth profile down to a few µm of solid materials |
| Confocal Raman Spectroscopy (SEM) | Fingerprint of chemical information, functional groups, 3D chemical mapping of solids and liquids |
| Nanoindentation | Mechanical properties of coatings, thin films, spatial dependence of hardness and elastic modulus. |
| Confocal Laser Scanning Microscopy | Surface roughness of solids; high resolution 3D optical images |