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X-ORIGINAL-URL:https://aif.ncsu.edu
X-WR-CALDESC:Events for Analytical Instrumentation Facility
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DTSTART;TZID=America/New_York:20181005T090000
DTEND;TZID=America/New_York:20181005T170000
DTSTAMP:20180827T193332Z
CREATED:20180827T193332Z
LAST-MODIFIED:20180827T193332Z
UID:10000489-1538730000-1538758800@aif.ncsu.edu
SUMMARY:TEM Short Course
DESCRIPTION:NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques\, which are very powerful to understand the morphology\, structure\, defects\, crystal orientation and phase information of materials\, as well as the chemical distribution down to atomic resolution. It is meant for new TEM users with an interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 1.5 hours of theory component (9:00am to 11:00am) and the rest of the day will be in laboratories. \nThis introductory course will cover the following topics: \n\nBasic principles of TEM\nBasic diffraction and imaging\nIntroduction of advanced characterization techniques\n\nAfter completion of this course\, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM\, what information the advanced TEM techniques can provide\, as well as how to design their own experiments for their projects. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \nIndustry: $350
URL:https://aif.ncsu.edu/event/tem-short-course/
LOCATION:1046 Engineering Building I\, 911 Partners Way\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,NC State,Short Course,TEM
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/08/Capture-e1535398403493.jpg
ORGANIZER;CN="Yang Liu":MAILTO:yliu78@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20181005T090000
DTEND;TZID=America/New_York:20181005T170000
DTSTAMP:20180918T140959Z
CREATED:20180823T132244Z
LAST-MODIFIED:20180918T140959Z
UID:10000486-1538730000-1538758800@aif.ncsu.edu
SUMMARY:FIB Short Course
DESCRIPTION:The FIB short course includes lectures covering an introduction to the FIB technique\, an overview of the principles and operation of the FIB\, as well as applications such as FIB prepared SEM and TEM cross section. Also\, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB\, the course will be limited to 4 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/fib-short-course-2/
LOCATION:119 Monteith Research Center\, 2410 Campus Shore Drive\, MRC room 119\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,FIB,NC State,Short Course
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2013/03/FIB_liftout-e1365428721893.jpg
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;VALUE=DATE:20181107
DTEND;VALUE=DATE:20181109
DTSTAMP:20181008T155003Z
CREATED:20181008T154012Z
LAST-MODIFIED:20181008T155003Z
UID:10000492-1541548800-1541721599@aif.ncsu.edu
SUMMARY:EBSD Workshop
DESCRIPTION:REGISTER HERE!
URL:https://aif.ncsu.edu/event/ebsd-workshop/
LOCATION:463 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 463\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,NC State,Workshop
ATTACH;FMTTYPE=image/png:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/10/EBSD-abstract-NCState-Nov2018-e1539012976408.png
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20181107T040000
DTEND;TZID=America/New_York:20181107T170000
DTSTAMP:20181023T183300Z
CREATED:20181023T183146Z
LAST-MODIFIED:20181023T183300Z
UID:10000493-1541563200-1541610000@aif.ncsu.edu
SUMMARY:Comparative Medicine Institute Seminar with Dr. Shadow Huang
DESCRIPTION:
URL:https://aif.ncsu.edu/event/cmi-seminar-huang/
LOCATION:CVM Research Building; Room 101\, College of Veterinary Medicine Research Bldg\, 1060 William Moore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,Seminar
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/10/6-CMI-Huang-11_7_18-1-1-e1540319530486.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20181108T090000
DTEND;TZID=America/New_York:20181108T160000
DTSTAMP:20181101T130829Z
CREATED:20181008T144547Z
LAST-MODIFIED:20181101T130829Z
UID:10000491-1541667600-1541692800@aif.ncsu.edu
SUMMARY:(CANCELLED) Sample Preparation Workshop
DESCRIPTION:Register Here!
URL:https://aif.ncsu.edu/event/sample-preparation-workshop/
LOCATION:306 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 306\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,NC State,Workshop
ATTACH;FMTTYPE=image/png:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/10/181004_SamplePrep_Workshop_Flyer-1-e1539009161102.png
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20181109T090000
DTEND;TZID=America/New_York:20181109T170000
DTSTAMP:20180815T193059Z
CREATED:20180815T134852Z
LAST-MODIFIED:20180815T193059Z
UID:10000477-1541754000-1541782800@aif.ncsu.edu
SUMMARY:Carolina Science Symposium
DESCRIPTION:REGISTER HERE!\n\n\n\n\n\n\n 
URL:https://aif.ncsu.edu/event/2018-carolina-science-symposium/
LOCATION:McKimmon Center\, 1101 Gorman Street\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,NC State,Symposium
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/08/180807_CSS_Flyer-4.jpg
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
GEO:35.7827332;-78.6851236
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=McKimmon Center 1101 Gorman Street Raleigh NC 27606 United States;X-APPLE-RADIUS=500;X-TITLE=1101 Gorman Street:geo:-78.6851236,35.7827332
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20181116T090000
DTEND;TZID=America/New_York:20181116T160000
DTSTAMP:20181005T130608Z
CREATED:20181005T130528Z
LAST-MODIFIED:20181005T130608Z
UID:10000490-1542358800-1542384000@aif.ncsu.edu
SUMMARY:X-ray Diffraction (XRD) Short Course
DESCRIPTION:This introductory XRD short course will cover basic principles of X-ray diffraction\, operation of diffractometers in Bragg-Brentano geometry (typically used for powders)\, and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component\, 1 hour of phase identification training in the AIF Data Analysis center\, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety\, attendees will be able to independently operate a diffractometer in basic mode. In order to facilitate authorization to use the equipment\, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details here for this information and other requirements to gain future access to the instruments). The course is limited to 6 people. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/x-ray-diffraction-xrd-short-course/
LOCATION:324 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,Short Course,XRD
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/08/IMG_5550-e1534874762523.jpg
ORGANIZER;CN="Ching-Chang (BB) Chung":MAILTO:cchung4@ncsu.edu
GEO:35.7694934;-78.6790169
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=324 Monteith Research Center 2410 Campus Shore Drive Raleigh NC 27606 United States;X-APPLE-RADIUS=500;X-TITLE=2410 Campus Shore Drive:geo:-78.6790169,35.7694934
END:VEVENT
BEGIN:VEVENT
DTSTART;VALUE=DATE:20181122
DTEND;VALUE=DATE:20181124
DTSTAMP:20181114T144144Z
CREATED:20181114T144144Z
LAST-MODIFIED:20181114T144144Z
UID:10000494-1542844800-1543017599@aif.ncsu.edu
SUMMARY:University Holiday – AIF in After Hours Status
DESCRIPTION:During Thanksgiving break\, AIF will be accessible only to those with after hours access to MRC and interior AIF doors. Security Applications & Technologies (SAT) will be locking all the electronically locked doors on Campus on Thursday and Friday. Access to buildings with electronic card access will be by ID card access only. \nTo get after hours access\, please fill out the MRC After Hours Access Form and submit it prior to 11/21 for processing.
URL:https://aif.ncsu.edu/event/thanksgiving-2018/
LOCATION:NC
CATEGORIES:AIF,NC State
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20181130T150000
DTEND;TZID=America/New_York:20181130T160000
DTSTAMP:20181121T162102Z
CREATED:20181121T161845Z
LAST-MODIFIED:20181121T162102Z
UID:10000496-1543590000-1543593600@aif.ncsu.edu
SUMMARY:TEM User Meeting
DESCRIPTION:AIF has seen many recent changes in the TEM labs and a few more changes will roll-out soon. To stay updated with how these important changes will affect your access to\, and operation of\, the TEM instruments and sample preparation lab\, Jacob Jones (Director of AIF) is hosting an all-hands TEM user meeting on Friday\, Nov 30\, at 3 PM in EB1 room 1005. If you are a currently trained operator of a TEM instrument in AIF\, your attendance is needed at this meeting. For users that cannot attend\, you may be asked to meet individually with a staff member afterwards to assess your situation.\n\nThanks and we look forward to your continued success in our lab and participation in a vibrant analytical facility.
URL:https://aif.ncsu.edu/event/tem-user-meeting/
LOCATION:1005 Engineering Building I\, 911 Partners Way\, Engineering Building I\, room 1005\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF
ORGANIZER;CN="Jacob Jones":MAILTO:jacobjones@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20181214T090000
DTEND;TZID=America/New_York:20181214T160000
DTSTAMP:20181210T194201Z
CREATED:20181130T173243Z
LAST-MODIFIED:20181210T194201Z
UID:10000498-1544778000-1544803200@aif.ncsu.edu
SUMMARY:(CANCELLED) FIB Short Course
DESCRIPTION:The FIB short course includes lectures covering an introduction to the FIB technique\, an overview of the principles and operation of the FIB\, as well as applications such as FIB prepared SEM and TEM cross section. Also\, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB\, the course will be limited to 4 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/dec2018-fib/
LOCATION:119 Monteith Research Center\, 2410 Campus Shore Drive\, MRC room 119\, Raleigh\, NC\, 27606\, United States
CATEGORIES:AIF,FIB,Short Course
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/11/180404_FIB_Ion_Image_Metal_Particle-e1543599119932.jpg
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190125T090000
DTEND;TZID=America/New_York:20190125T160000
DTSTAMP:20181130T144359Z
CREATED:20181130T144319Z
LAST-MODIFIED:20181130T144359Z
UID:10000497-1548406800-1548432000@aif.ncsu.edu
SUMMARY:X-ray Diffraction (XRD) Short Course
DESCRIPTION:This introductory XRD short course will cover basic principles of X-ray diffraction\, operation of diffractometers in Bragg-Brentano geometry (typically used for powders)\, and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component\, 1 hour of phase identification training in the AIF Data Analysis center\, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety\, attendees will be able to independently operate a diffractometer in basic mode. In order to facilitate authorization to use the equipment\, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details here for this information and other requirements to gain future access to the instruments). The course is limited to 6 people. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/jan2019-xrd/
LOCATION:324 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,Short Course,XRD
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/11/2D-XRD-on-Ramiz-sample-e1543589029918.jpg
ORGANIZER;CN="Ching-Chang (BB) Chung":MAILTO:cchung4@ncsu.edu
GEO:35.7694934;-78.6790169
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=324 Monteith Research Center 2410 Campus Shore Drive Raleigh NC 27606 United States;X-APPLE-RADIUS=500;X-TITLE=2410 Campus Shore Drive:geo:-78.6790169,35.7694934
END:VEVENT
BEGIN:VEVENT
DTSTART;VALUE=DATE:20190129
DTEND;VALUE=DATE:20190131
DTSTAMP:20181130T154003Z
CREATED:20181120T155721Z
LAST-MODIFIED:20181130T154003Z
UID:10000495-1548720000-1548892799@aif.ncsu.edu
SUMMARY:Raman Spectroscopy Tutorial
DESCRIPTION:Raman Spectroscopy has gained much attention in the past 25 years as a material analytics and diagnostics method\, often used as a complement to diffraction or electron microscopy techniques. This interest is triggered by Raman being a (mostly) non-destructive measurement that can be obtained with easy-to-use\, tabletop equipment. The Raman signal is a type of inelastic scattering from molecular or crystal vibrations\, and as such it is a fingerprint of the state the solid assumes. Any changes in composition\, phase\, mechanical properties (among others) would in fact leave a trace in the Raman spectral signature. Despite its potential and versatility\, however\, the Raman technique is not as widespread as diffraction methods\, mostly due to difficulties in data interpretation. This lecture uncovers most practical and critical aspects of Raman spectroscopy\, and presents the ample possibilities offered by Raman for the most variate analyses in materials science. The aim of this lecture is to discuss the criticalities and to convey the advantages of Raman spectroscopy to a wider audience in materials science. \nThe course is organized as follows:  \nThe theory of Raman spectroscopy is first detailed\, focusing on the identification and assignment of Raman vibrations. Then\, information on Raman spectroscopic equipment and their working principles is given\, including details on spectral fitting procedures. Finally\, the course is completed by several examples of application of Raman spectroscopy on ceramic\, semiconductor and polymeric samples. \nFor the demonstration\, Marco will do three measurements:  \n(i) detection of the ferroelectric-paraelectric transition in barium titanate\, (ii) mapping of monoclinic content in zirconia\, (iii) mapping of pharmaceutical tablets. \nUsers can bring their own samples- please let us know what type of sample(s) you will bring in the registration form. \nJanuary 29th – Lectures  \nJanuary 30th – Hands-on activities  \nShort Bio \nMarco Deluca received a Master in Chemical Engineering from the University of Trieste (Italy) and a Ph. D. in Materials Science from Kyoto Institute of Technology (Japan). He obtained in 2016 the Habilitation (venia docendi) in Materials Science from the Montanuniversität Leoben (Leoben\, Austria). The main theme of his scientific career is the study of structure-property relationships in functional oxide materials including ceramics and semiconductors for sensors/actuators\, energy harvesting/storage and gas sensing applications. He is a member of the IEEE\, of the American Ceramic Society and member of the Board of Directors of the Austrian Ceramic Society. He authored/co-authored more than 60 refereed publications in journals and conferences and two book chapters\, and gave more than 20 invited presentations to international conferences and workshops. Marco Deluca is also Lecturer in the Materials Science Department of the Montanuniversität Leoben (Leoben\, Austria). \n  \nRegister Here
URL:https://aif.ncsu.edu/event/raman-spectroscopy-tutorial/
LOCATION:136 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,Tutorial
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/11/wdwq-e1543592373672.jpg
ORGANIZER;CN="Elaine Zhou":MAILTO:czhou@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190208T090000
DTEND;TZID=America/New_York:20190208T170000
DTSTAMP:20190125T213445Z
CREATED:20190125T213445Z
LAST-MODIFIED:20190125T213445Z
UID:10000511-1549616400-1549645200@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/sem-short-course/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190208T090000
DTEND;TZID=America/New_York:20190208T170000
DTSTAMP:20190115T134825Z
CREATED:20190111T154514Z
LAST-MODIFIED:20190115T134825Z
UID:10000510-1549616400-1549645200@aif.ncsu.edu
SUMMARY:Vacuum Technology Short Course
DESCRIPTION:The Vacuum Technology short course covers the vacuum pumps\, gauges\, fittings\, and other equipment commonly found in vacuum systems. Students will learn how to operate and make changes to a working system. Copies of the slides used in the course will be provided to each student. To provide each student with the opportunity to use the vacuum instrumentation\, the course is limited to four students. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/vacuum-technology-short-course/
LOCATION:320 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 320\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2019/01/vacuum-e1547221573519.jpg
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190222T090000
DTEND;TZID=America/New_York:20190222T170000
DTSTAMP:20190125T211536Z
CREATED:20190107T151537Z
LAST-MODIFIED:20190125T211536Z
UID:10000509-1550826000-1550854800@aif.ncsu.edu
SUMMARY:FIB Short Course
DESCRIPTION:The FIB short course includes lectures covering an introduction to the FIB technique\, an overview of the principles and operation of the FIB\, as well as applications such as FIB prepared SEM and TEM cross section. Also\, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB\, the course will be limited to 4 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/fib-short-course-3/
LOCATION:119 Monteith Research Center\, 2410 Campus Shore Drive\, MRC room 119\, Raleigh\, NC\, 27606\, United States
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2019/01/FIB_liftout-e1365428721893-1.jpg
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190301T090000
DTEND;TZID=America/New_York:20190301T170000
DTSTAMP:20190125T213610Z
CREATED:20190125T213610Z
LAST-MODIFIED:20190125T213610Z
UID:10000512-1551430800-1551459600@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/sem-short-course-2/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190315T090000
DTEND;TZID=America/New_York:20190315T170000
DTSTAMP:20190213T174242Z
CREATED:20190213T174210Z
LAST-MODIFIED:20190213T174242Z
UID:10000519-1552640400-1552669200@aif.ncsu.edu
SUMMARY:X-ray Diffraction (XRD) Short Course
DESCRIPTION:This introductory XRD short course will cover basic principles of X-ray diffraction\, operation of diffractometers in Bragg-Brentano geometry (typically used for powders)\, and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component\, 1 hour of phase identification training in the AIF Data Analysis center\, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety\, attendees will be able to independently operate a diffractometer in basic mode. In order to facilitate authorization to use the equipment\, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details here for this information and other requirements to gain future access to the instruments). The course is limited to 6 people. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/x-ray-diffraction-xrd-short-course-2/
LOCATION:324 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course,XRD
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/11/2D-XRD-on-Ramiz-sample-e1543589029918.jpg
ORGANIZER;CN="Ching-Chang (BB) Chung":MAILTO:cchung4@ncsu.edu
GEO:35.7694934;-78.6790169
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=324 Monteith Research Center 2410 Campus Shore Drive Raleigh NC 27606 United States;X-APPLE-RADIUS=500;X-TITLE=2410 Campus Shore Drive:geo:-78.6790169,35.7694934
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190405T090000
DTEND;TZID=America/New_York:20190405T170000
DTSTAMP:20190125T213730Z
CREATED:20190125T213730Z
LAST-MODIFIED:20190125T213730Z
UID:10000513-1554454800-1554483600@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/sem-short-course-3/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190426T090000
DTEND;TZID=America/New_York:20190426T170000
DTSTAMP:20190410T155902Z
CREATED:20190410T155902Z
LAST-MODIFIED:20190410T155902Z
UID:10000520-1556269200-1556298000@aif.ncsu.edu
SUMMARY:FIB Short Course
DESCRIPTION:The FIB short course includes lectures covering an introduction to the FIB technique\, an overview of the principles and operation of the FIB\, as well as applications such as FIB prepared SEM and TEM cross section. Also\, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB\, the course will be limited to 4 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/fib-short-course-4/
LOCATION:119 Monteith Research Center\, 2410 Campus Shore Drive\, MRC room 119\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,FIB,Short Course
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190503T090000
DTEND;TZID=America/New_York:20190503T170000
DTSTAMP:20190503T123438Z
CREATED:20190410T160132Z
LAST-MODIFIED:20190503T123438Z
UID:10000522-1556874000-1556902800@aif.ncsu.edu
SUMMARY:Vacuum Technology Short Course
DESCRIPTION:The Vacuum Technology short course covers the vacuum pumps\, gauges\, fittings\, and other equipment commonly found in vacuum systems. Students will learn how to operate and make changes to a working system. Copies of the slides used in the course will be provided to each student. To provide each student with the opportunity to use the vacuum instrumentation\, the course is limited to four students. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/vacuum-technology-short-course-2/
LOCATION:303 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 303\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190510T090000
DTEND;TZID=America/New_York:20190510T170000
DTSTAMP:20190125T213839Z
CREATED:20190125T213839Z
LAST-MODIFIED:20190125T213839Z
UID:10000514-1557478800-1557507600@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/sem-short-course-4/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190614T080000
DTEND;TZID=America/New_York:20190614T170000
DTSTAMP:20190510T145713Z
CREATED:20190429T151804Z
LAST-MODIFIED:20190510T145713Z
UID:10000524-1560499200-1560531600@aif.ncsu.edu
SUMMARY:Surface Analysis (XPS and ToF-SIMS) Short Course
DESCRIPTION:NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon\, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/surface-analysis-xps-and-tof-sims-short-course-2/
LOCATION:320 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 320\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190614T090000
DTEND;TZID=America/New_York:20190614T170000
DTSTAMP:20190530T172041Z
CREATED:20190125T213931Z
LAST-MODIFIED:20190530T172041Z
UID:10000515-1560502800-1560531600@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/sem-short-course-5/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190719T090000
DTEND;TZID=America/New_York:20190719T170000
DTSTAMP:20190717T151454Z
CREATED:20190612T144950Z
LAST-MODIFIED:20190717T151454Z
UID:10000526-1563526800-1563555600@aif.ncsu.edu
SUMMARY:[CANCELLED] FIB Short Course
DESCRIPTION:The FIB short course includes lectures covering an introduction to the FIB technique\, an overview of the principles and operation of the FIB\, as well as applications such as FIB prepared SEM and TEM cross section. Also\, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB\, the course will be limited to 4 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/fib-short-course-5/
LOCATION:119 Monteith Research Center\, 2410 Campus Shore Drive\, MRC room 119\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190726T090000
DTEND;TZID=America/New_York:20190726T170000
DTSTAMP:20190612T145811Z
CREATED:20190612T145811Z
LAST-MODIFIED:20190612T145811Z
UID:10000529-1564131600-1564160400@aif.ncsu.edu
SUMMARY:Vacuum Technology Short Course
DESCRIPTION:The Vacuum Technology short course covers the vacuum pumps\, gauges\, fittings\, and other equipment commonly found in vacuum systems. Students will learn how to operate and make changes to a working system. Copies of the slides used in the course will be provided to each student. To provide each student with the opportunity to use the vacuum instrumentation\, the course is limited to four students. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/vacuum-technology-short-course-3/
LOCATION:320 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 320\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190802T090000
DTEND;TZID=America/New_York:20190802T170000
DTSTAMP:20190530T172208Z
CREATED:20190125T214035Z
LAST-MODIFIED:20190530T172208Z
UID:10000516-1564736400-1564765200@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/sem-short-course-6/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190809T153000
DTEND;TZID=America/New_York:20190809T170000
DTSTAMP:20190628T154308Z
CREATED:20190628T153843Z
LAST-MODIFIED:20190628T154308Z
UID:10000531-1565364600-1565370000@aif.ncsu.edu
SUMMARY:AIF Cool Science Seminar Series: Dr. Roland Brunner
DESCRIPTION:Come grab a bowl of Howling Cow Ice Cream and join us for a talk in the AIF Seminar Series. Dr. Roland Brunner\, group leader at the Materials Center Leoben\, Forschung GmbH (MCL)\, will present 3D imaging methods and quantitative analysis for advanced material science (abstract below). The AIF Seminar Series is designed to be informal\, interactive\, and fun. There will be plenty of opportunities to discuss science and network. \nPlease RSVP here by August 5\, 2019. \n3D Imaging Methods and Quantitative Analysis for Advanced Material Science \nAbstract \nA rapidly developing area in material science displays the three-dimensional characterization of the microstructure using tomography based imaging methods. The use of quantified 3D structural information offers new possibilities with respect to an improved understanding about the correlation between microstructure and functionality as well as for more advanced material designs.  In this context\, several experimental approaches like X-ray computed tomography\, X-ray microscopy\, SEM/FIB-tomography or synchrotron 3D imaging represent highly powerful techniques. Here\, important key parameters display the possible resolution as well as achievable contrast. Another challenge comprises the quantification of the 3D image data. However\, a critical analysis is seldom undertaken. \nIn this talk\, I will discuss the use of different 3D imaging techniques for the investigation of novel material concepts e.g. suitable for energy storage applications or microelectronics. This will particularly cover a discussion regarding the correlation between microstructure and material e.g. electrical\, mechanical or electrochemical material properties. Further\, I will present an image analysis workflow suitable for material characterization. This workflow comprises the (1) pre-processing e.g. artefact reduction and image quality improvement\, (2) segmentation e.g. particles\, pores\, etc. as well as the (3) post-processing of the data e.g. the quantification of the pore network behavior\, particle\, or the use of FEM simulations in combination with 3D image data. \nShort Biography \nDr. Roland Brunner is a group leader at the Materials Center Leoben\, Forschung GmbH (MCL)\, lecturer at the Montanuniversitaet Leoben\,and coopted at the PhD school for Physics at faculty of natural science\, University Graz. He holds a PhD in Material/Semiconductor physics. From 2006 to 2012 he was a Postdoc at the University Leoben and Japan\, NTT & Tokyo University dealing with Electron Spin based Quantum Information in semiconductors. In addition\, he was a short term researcher at Chiba University\, Japan\, as well as the Electrical Engineering Department at ASU\, USA. He has been at the MCL since 2012. In 2014 he made his postdoctoral lecture qualification and was appointed to Priv. Doz. He has been a leader of the micro- and nanostructure visualization group since 2018. His research interests span the further development of 2D/3D imaging methods as well as image analysis approaches for industrial relevant material- and failure -characterization. Experimental methods comprises e.g. acoustic microscopy\, or tomography based methods like SEM/FIB-\, X-ray- computed as well as synchrotron 3D imaging.
URL:https://aif.ncsu.edu/event/coolscience2019/
LOCATION:136 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Cool Science,Seminar
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2019/06/Bild_Roland-Brunner.jpg
ORGANIZER;CN="Anna Lumpkin":MAILTO:arlumpkin@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190830T133000
DTEND;TZID=America/New_York:20190830T160000
DTSTAMP:20190711T153002Z
CREATED:20190711T152738Z
LAST-MODIFIED:20190711T153002Z
UID:10000533-1567171800-1567180800@aif.ncsu.edu
SUMMARY:2019 AIF Open House & User Appreciation
DESCRIPTION:AIF is excited to host it’s annual Open House & User Appreciation on August 30\, 2019.\nPlease join us for our annual Open House & User Appreciation. During this time\, we’ll have an introduction for new users (presented by Dr. Chris Winkler)\, AIF tours for new and existing users\, and an ice cream social featuring NC State’s Howling Cow ice cream. Although the event is free\, please make sure to RSVP in order to ensure we have plenty of ice cream for all.
URL:https://aif.ncsu.edu/event/2019-aif-open-house-user-appreciation/
LOCATION:136 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2019/07/2019-AIF-Open-House-Flyer-e1562858895543.jpeg
ORGANIZER;CN="Anna Lumpkin":MAILTO:arlumpkin@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190913T080000
DTEND;TZID=America/New_York:20190913T170000
DTSTAMP:20190821T194704Z
CREATED:20190821T194704Z
LAST-MODIFIED:20190821T194704Z
UID:10000539-1568361600-1568394000@aif.ncsu.edu
SUMMARY:Vacuum Technology Short Course
DESCRIPTION:The Vacuum Technology short course covers the vacuum pumps\, gauges\, fittings\, and other equipment commonly found in vacuum systems. Students will learn how to operate and make changes to a working system. Copies of the slides used in the course will be provided to each student. To provide each student with the opportunity to use the vacuum instrumentation\, the course is limited to four students. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/vacuum-technology-short-course-4/
LOCATION:320 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 320\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190913T090000
DTEND;TZID=America/New_York:20190913T170000
DTSTAMP:20190830T154738Z
CREATED:20190125T214123Z
LAST-MODIFIED:20190830T154738Z
UID:10000517-1568365200-1568394000@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350 \nShort courses are typically scheduled for the first or second Friday of every month except July and December. If there is enough demand\, additional short courses can be added. Please contact Chuck Mooney to discuss at chuck_mooney@ncsu.edu.
URL:https://aif.ncsu.edu/event/sem-short-course-7/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
END:VCALENDAR