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DTSTART;TZID=America/New_York:20190726T090000
DTEND;TZID=America/New_York:20190726T170000
DTSTAMP:20190612T145811Z
CREATED:20190612T145811Z
LAST-MODIFIED:20190612T145811Z
UID:10000529-1564131600-1564160400@aif.ncsu.edu
SUMMARY:Vacuum Technology Short Course
DESCRIPTION:The Vacuum Technology short course covers the vacuum pumps\, gauges\, fittings\, and other equipment commonly found in vacuum systems. Students will learn how to operate and make changes to a working system. Copies of the slides used in the course will be provided to each student. To provide each student with the opportunity to use the vacuum instrumentation\, the course is limited to four students. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/vacuum-technology-short-course-3/
LOCATION:320 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 320\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190802T090000
DTEND;TZID=America/New_York:20190802T170000
DTSTAMP:20190530T172208Z
CREATED:20190125T214035Z
LAST-MODIFIED:20190530T172208Z
UID:10000516-1564736400-1564765200@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/sem-short-course-6/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190809T153000
DTEND;TZID=America/New_York:20190809T170000
DTSTAMP:20190628T154308Z
CREATED:20190628T153843Z
LAST-MODIFIED:20190628T154308Z
UID:10000531-1565364600-1565370000@aif.ncsu.edu
SUMMARY:AIF Cool Science Seminar Series: Dr. Roland Brunner
DESCRIPTION:Come grab a bowl of Howling Cow Ice Cream and join us for a talk in the AIF Seminar Series. Dr. Roland Brunner\, group leader at the Materials Center Leoben\, Forschung GmbH (MCL)\, will present 3D imaging methods and quantitative analysis for advanced material science (abstract below). The AIF Seminar Series is designed to be informal\, interactive\, and fun. There will be plenty of opportunities to discuss science and network. \nPlease RSVP here by August 5\, 2019. \n3D Imaging Methods and Quantitative Analysis for Advanced Material Science \nAbstract \nA rapidly developing area in material science displays the three-dimensional characterization of the microstructure using tomography based imaging methods. The use of quantified 3D structural information offers new possibilities with respect to an improved understanding about the correlation between microstructure and functionality as well as for more advanced material designs.  In this context\, several experimental approaches like X-ray computed tomography\, X-ray microscopy\, SEM/FIB-tomography or synchrotron 3D imaging represent highly powerful techniques. Here\, important key parameters display the possible resolution as well as achievable contrast. Another challenge comprises the quantification of the 3D image data. However\, a critical analysis is seldom undertaken. \nIn this talk\, I will discuss the use of different 3D imaging techniques for the investigation of novel material concepts e.g. suitable for energy storage applications or microelectronics. This will particularly cover a discussion regarding the correlation between microstructure and material e.g. electrical\, mechanical or electrochemical material properties. Further\, I will present an image analysis workflow suitable for material characterization. This workflow comprises the (1) pre-processing e.g. artefact reduction and image quality improvement\, (2) segmentation e.g. particles\, pores\, etc. as well as the (3) post-processing of the data e.g. the quantification of the pore network behavior\, particle\, or the use of FEM simulations in combination with 3D image data. \nShort Biography \nDr. Roland Brunner is a group leader at the Materials Center Leoben\, Forschung GmbH (MCL)\, lecturer at the Montanuniversitaet Leoben\,and coopted at the PhD school for Physics at faculty of natural science\, University Graz. He holds a PhD in Material/Semiconductor physics. From 2006 to 2012 he was a Postdoc at the University Leoben and Japan\, NTT & Tokyo University dealing with Electron Spin based Quantum Information in semiconductors. In addition\, he was a short term researcher at Chiba University\, Japan\, as well as the Electrical Engineering Department at ASU\, USA. He has been at the MCL since 2012. In 2014 he made his postdoctoral lecture qualification and was appointed to Priv. Doz. He has been a leader of the micro- and nanostructure visualization group since 2018. His research interests span the further development of 2D/3D imaging methods as well as image analysis approaches for industrial relevant material- and failure -characterization. Experimental methods comprises e.g. acoustic microscopy\, or tomography based methods like SEM/FIB-\, X-ray- computed as well as synchrotron 3D imaging.
URL:https://aif.ncsu.edu/event/coolscience2019/
LOCATION:136 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Cool Science,Seminar
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2019/06/Bild_Roland-Brunner.jpg
ORGANIZER;CN="Anna Lumpkin":MAILTO:arlumpkin@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190830T133000
DTEND;TZID=America/New_York:20190830T160000
DTSTAMP:20190711T153002Z
CREATED:20190711T152738Z
LAST-MODIFIED:20190711T153002Z
UID:10000533-1567171800-1567180800@aif.ncsu.edu
SUMMARY:2019 AIF Open House & User Appreciation
DESCRIPTION:AIF is excited to host it’s annual Open House & User Appreciation on August 30\, 2019.\nPlease join us for our annual Open House & User Appreciation. During this time\, we’ll have an introduction for new users (presented by Dr. Chris Winkler)\, AIF tours for new and existing users\, and an ice cream social featuring NC State’s Howling Cow ice cream. Although the event is free\, please make sure to RSVP in order to ensure we have plenty of ice cream for all.
URL:https://aif.ncsu.edu/event/2019-aif-open-house-user-appreciation/
LOCATION:136 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2019/07/2019-AIF-Open-House-Flyer-e1562858895543.jpeg
ORGANIZER;CN="Anna Lumpkin":MAILTO:arlumpkin@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190913T080000
DTEND;TZID=America/New_York:20190913T170000
DTSTAMP:20190821T194704Z
CREATED:20190821T194704Z
LAST-MODIFIED:20190821T194704Z
UID:10000539-1568361600-1568394000@aif.ncsu.edu
SUMMARY:Vacuum Technology Short Course
DESCRIPTION:The Vacuum Technology short course covers the vacuum pumps\, gauges\, fittings\, and other equipment commonly found in vacuum systems. Students will learn how to operate and make changes to a working system. Copies of the slides used in the course will be provided to each student. To provide each student with the opportunity to use the vacuum instrumentation\, the course is limited to four students. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/vacuum-technology-short-course-4/
LOCATION:320 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 320\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190913T090000
DTEND;TZID=America/New_York:20190913T170000
DTSTAMP:20190830T154738Z
CREATED:20190125T214123Z
LAST-MODIFIED:20190830T154738Z
UID:10000517-1568365200-1568394000@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350 \nShort courses are typically scheduled for the first or second Friday of every month except July and December. If there is enough demand\, additional short courses can be added. Please contact Chuck Mooney to discuss at chuck_mooney@ncsu.edu.
URL:https://aif.ncsu.edu/event/sem-short-course-7/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20190920T080000
DTEND;TZID=America/New_York:20190920T170000
DTSTAMP:20190821T194822Z
CREATED:20190821T194822Z
LAST-MODIFIED:20190821T194822Z
UID:10000540-1568966400-1568998800@aif.ncsu.edu
SUMMARY:Surface Analysis (XPS and ToF-SIMS) Short Course
DESCRIPTION:NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon\, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/surface-analysis-xps-and-tof-sims-short-course-3/
LOCATION:320 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 320\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191004T080000
DTEND;TZID=America/New_York:20191004T170000
DTSTAMP:20190924T195202Z
CREATED:20190821T194433Z
LAST-MODIFIED:20190924T195202Z
UID:10000538-1570176000-1570208400@aif.ncsu.edu
SUMMARY:FIB Short Course
DESCRIPTION:The FIB short course includes lectures covering an introduction to the FIB technique\, an overview of the principles and operation of the FIB\, as well as applications such as FIB prepared SEM and TEM cross section. Also\, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB\, the course will be limited to 4 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/fib-short-course-6/
LOCATION:119 Monteith Research Center\, 2410 Campus Shore Drive\, MRC room 119\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,FIB,Short Course
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191004T090000
DTEND;TZID=America/New_York:20191004T170000
DTSTAMP:20190827T160102Z
CREATED:20190827T160102Z
LAST-MODIFIED:20190827T160102Z
UID:10000541-1570179600-1570208400@aif.ncsu.edu
SUMMARY:X-ray Diffraction (XRD) Short Course
DESCRIPTION:This introductory XRD short course will cover basic principles of X-ray diffraction\, operation of diffractometers in Bragg-Brentano geometry (typically used for powders)\, and basic phase identification. It is meant for first-time XRD users and/or those interested in learning phase identification and pattern matching in HighScore software. The course will include 1 hour theory component\, 1 hour of phase identification training in the AIF Data Analysis center\, and 1-3 hours of a practical component in the XRD lab (as needed). After completion of this course and the EH&S course on Analytical X-ray Safety\, attendees will be able to independently operate a diffractometer in basic mode. In order to facilitate authorization to use the equipment\, participants are encouraged to take the Analytical X-ray Safety offered by EH&S (see details here for this information and other requirements to gain future access to the instruments). The course is limited to 6 people. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/x-ray-diffraction-xrd-short-course-3/
LOCATION:324 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Ching-Chang (BB) Chung":MAILTO:cchung4@ncsu.edu
GEO:35.7694934;-78.6790169
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=324 Monteith Research Center 2410 Campus Shore Drive Raleigh NC 27606 United States;X-APPLE-RADIUS=500;X-TITLE=2410 Campus Shore Drive:geo:-78.6790169,35.7694934
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191007T100000
DTEND;TZID=America/New_York:20191008T160000
DTSTAMP:20190909T182648Z
CREATED:20190909T182527Z
LAST-MODIFIED:20190909T182648Z
UID:10000544-1570442400-1570550400@aif.ncsu.edu
SUMMARY:Appalachian Regional Microscopy Society (AReMS) Fall Conference
DESCRIPTION:AReMS meets annually with an invigorating program of technical talks\, vendor displays\, work shops and social activities. They have interest in microscopy of any type including optical\, electron\, ion and scanned probe microscopies. \nTutorials will be held on Monday\, with a banquet Monday evening. Talks will take place on Tuesday. For more information\, to register\, and to view an agenda\, please visit the event website linked below.
URL:https://aif.ncsu.edu/event/appalachian-regional-microscopy-society-arems-fall-conference/
LOCATION:Fitzpatrick Center for Interdisciplinary Engineering\, 101 Science Dr.\, Durham\, NC\, 27705\, United States
CATEGORIES:2019
ORGANIZER;CN="Michelle Plue":MAILTO:michelle.plue@duke.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191011T090000
DTEND;TZID=America/New_York:20191011T170000
DTSTAMP:20190909T181347Z
CREATED:20190909T181347Z
LAST-MODIFIED:20190909T181347Z
UID:10000543-1570784400-1570813200@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350 \nShort courses are typically scheduled for the first or second Friday of every month except July and December. If there is enough demand\, additional short courses can be added. Please contact Chuck Mooney to discuss at chuck_mooney@ncsu.edu.
URL:https://aif.ncsu.edu/event/sem-short-course-9/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191018T090000
DTEND;TZID=America/New_York:20191018T130000
DTSTAMP:20190827T185022Z
CREATED:20190827T184953Z
LAST-MODIFIED:20190827T185022Z
UID:10000542-1571389200-1571403600@aif.ncsu.edu
SUMMARY:Nanoindentation Short Course
DESCRIPTION:This introductory nanoindentation short course will cover basic principles of nanoindentation including basic theory\, applications\, and factors to consider in planning experiments. This course is designed for first-time users and those interested in learning about nanoindentation and how the technique can be applied to their research. The course will include a 1 hour introductory presentation\, followed by a 1 hour demonstration of the instrument and then up to 2 hours of shared hands-on time with user-provided samples. The course is limited to 3 people. \nPlease contact Phillip Strader (pmstrade@ncsu.edu) in advance to determine if any advanced sample preparation is needed prior to the short course. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/nanoindentation-short-course/
LOCATION:324A Monteith Research Center\, 2410 Campus Shore Drive\, Room 324A\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,Short Course
ORGANIZER;CN="Phillip Strader":MAILTO:pmstrade@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191030T133000
DTEND;TZID=America/New_York:20191030T143000
DTSTAMP:20191024T131702Z
CREATED:20191016T152708Z
LAST-MODIFIED:20191024T131702Z
UID:10000470-1572442200-1572445800@aif.ncsu.edu
SUMMARY:AIF Bio-Imaging Users Group Meeting
DESCRIPTION:  \nThe NC State Analytical Instrumentation Facility (AIF) is executing a strategic initiative to serve life sciences researchers. With our recently upgraded sample preparation labs with cryogenic instrumentation\, we offer a collection of cutting-edge instruments capable of probing the characteristics of samples consisting of plant and animal matter across a broad range of length scales\, thereby enabling researchers to discover fundamental properties of soft and/or biological materials and systems. \n \n  \nShadow Huang\, Aaron Bell\, and Ashley Brown will be leading an AIF bio-imaging user group meeting on October 30 from 1:30-2:30pm in MRC 463 (2410 Campus Shore Drive\, Raleigh\, NC 27695). If you’re interested\, please RSVP using the link below or email Shadow directly at hshuang@ncsu.edu. \n\n  \nRVSP Here
URL:https://aif.ncsu.edu/event/aif-bio-imaging-users-group-meeting/
LOCATION:463 Monteith Research Center
CATEGORIES:2019,AIF,NC State
ORGANIZER;CN="Shadow Huang":MAILTO:hshuang@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191101T090000
DTEND;TZID=America/New_York:20191101T170000
DTSTAMP:20190830T154705Z
CREATED:20190125T214232Z
LAST-MODIFIED:20190830T154705Z
UID:10000518-1572598800-1572627600@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350 \nShort courses are typically scheduled for the first or second Friday of every month except July and December. If there is enough demand\, additional short courses can be added. Please contact Chuck Mooney to discuss at chuck_mooney@ncsu.edu.
URL:https://aif.ncsu.edu/event/sem-short-course-8/
LOCATION:321 Monteith Research Center\, 2410 Campus Shore Drive\, Room 321\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191106T100000
DTEND;TZID=America/New_York:20191106T153000
DTSTAMP:20191015T193844Z
CREATED:20191015T193504Z
LAST-MODIFIED:20191015T193844Z
UID:10000554-1573034400-1573054200@aif.ncsu.edu
SUMMARY:Asylum Research AFM Workshop: In-liquid Applications on Biological Materials
DESCRIPTION:Learn how you can perform in-liquid operation techniques on soft biologically related materials with the Asylum Research Origin + AFM located in NC State’s Analytical Instrumentation Facility.\nRSVP Here\n\n\n\n\n\n\n 
URL:https://aif.ncsu.edu/event/asylum-afm-workshop/
LOCATION:463 Monteith Research Center\, 2410 Campus Shore Drive\, Room 463\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,NC State,Workshop
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191106T100000
DTEND;TZID=America/New_York:20191107T150000
DTSTAMP:20190923T200322Z
CREATED:20190920T130813Z
LAST-MODIFIED:20190923T200322Z
UID:10000545-1573034400-1573138800@aif.ncsu.edu
SUMMARY:Bio-Indentation Workshop
DESCRIPTION:  \n \n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\nAIF is excited to partner with Optics 11 on November 6-7\, 2019 for a bio-indentation workshop.\n  \nAttendees are strongly encouraged to bring their own samples. Although the workshop is free\, please make sure to RSVP.\n 
URL:https://aif.ncsu.edu/event/bio-indentation-workshop/
LOCATION:454 Monteith Research Center\, 2410 Campus Shore Drive\, Room 454\, Monteith Research Center (MRC)\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,NC State,Workshop
ORGANIZER;CN="Phillip Strader":MAILTO:pmstrade@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191107T110000
DTEND;TZID=America/New_York:20191107T140000
DTSTAMP:20191007T130638Z
CREATED:20191004T161951Z
LAST-MODIFIED:20191007T130638Z
UID:10000546-1573124400-1573135200@aif.ncsu.edu
SUMMARY:Technical Seminar on Atom Probe Tomography for Atomic Scale Characterization
DESCRIPTION:Hosted by CAMECA Instruments\nAtom Probe Tomography (APT) is the highest special resolution analytical characterization technique with high efficiency single atom detection for quantitative atom scale 3D compositional analysis and elemental mapping of chemical heterogeneities.  This talk will cover APT operational theory\, an introduction to sample prep and data reconstruction\, and an overview of various applications.  A commercial cryo-UHV solution for FIB-APT specimen transfer will also be presented which expands the application space for APT to biological materials\, hydrogen containing materials\, and surfaces prone to rapid oxidation. \nLunch will be included with registration. \nRSVP HERE\n\n\n\n\n\n\n 
URL:https://aif.ncsu.edu/event/atom-probe-tomography/
LOCATION:136 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,NC State,Seminar
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191107T143000
DTEND;TZID=America/New_York:20191107T170000
DTSTAMP:20191029T180125Z
CREATED:20191029T180125Z
LAST-MODIFIED:20191029T180125Z
UID:10000471-1573137000-1573146000@aif.ncsu.edu
SUMMARY:Bio-Microscopy Workshop
DESCRIPTION:Keyence is hosting a workshop focused on optical microscopy and fluorescence imaging of biological materials using their BZ-X800 microscope. Attendees are encouraged to bring their own samples to try imaging on the microscope. \nRSVP:  \nhttps://go.ncsu.edu/keyence-workshop \nQuestions?  \nContact Phillip Strader at pmstrade@ncsu.edu. \n 
URL:https://aif.ncsu.edu/event/bio-microscopy-workshop/
LOCATION:463 Monteith Research Center\, 2410 Campus Shore Drive\, Room 463\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,NC State,Workshop
ORGANIZER;CN="Phillip Strader":MAILTO:pmstrade@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191108T090000
DTEND;TZID=America/New_York:20191108T170000
DTSTAMP:20191002T180913Z
CREATED:20190816T182019Z
LAST-MODIFIED:20191002T180913Z
UID:10000536-1573203600-1573232400@aif.ncsu.edu
SUMMARY:Carolina Science Symposium
DESCRIPTION:The Carolina Science Symposium is expected to draw about 100 participants\, both locally and from the surrounding region. Topics in materials science\, processing\, characterization\, and biomaterials will be presented by both invited and selected student contributors. A student poster session will be held\, and 3 student contributed papers will be selected for 15 minute oral presentations. When registering\, you will be asked to indicate whether the abstract should be considered for a poster or for a talk (eligible for an oral presentation). Over $1000 will be awarded in prizes and drawings. The abstract deadline is November 1. More information can be found here. \nRegister Here\n\n\n\n\n\n\n  \nRegistration\n(includes snacks & lunch)\nProfessional: $20\nStudent: $10\nVendors: contact pmstrade@ncsu.edu or joeb@lesker.com \nInvited Talks \n\nVirtual Anatomy (Edwin Dickinson\, NCSU)\nDinosaur Analysis (Mary Schweitzer\, NC State)\nNanoscience & Nanoengineering at JSNN (Sherine Obare\, JSNN)\nArtificial Intelligence (John Oakley\, SRC)
URL:https://aif.ncsu.edu/event/carolina-science-symposium/
LOCATION:McKimmon Center\, 1101 Gorman Street\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,Symposium
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
GEO:35.7827332;-78.6851236
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=McKimmon Center 1101 Gorman Street Raleigh NC 27606 United States;X-APPLE-RADIUS=500;X-TITLE=1101 Gorman Street:geo:-78.6851236,35.7827332
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191108T110000
DTEND;TZID=America/New_York:20191108T120000
DTSTAMP:20191029T201754Z
CREATED:20191029T201754Z
LAST-MODIFIED:20191029T201754Z
UID:10000473-1573210800-1573214400@aif.ncsu.edu
SUMMARY:MSE Seminar with Sergei V. Kalinin from Oak Ridge\, TN
DESCRIPTION:Speaker: Sergei V. Kalinin\, A Material Opportunity: How Microscopy and Autonomous Experimentation Can Accelerate Materials Design\n\nAffiliation: The Center for Nanophase Materials Sciences\, Oak Ridge National Laboratories\, Oak Ridge\, TN\n  \n  \n\nA Material Opportunity: How Microscopy and Autonomous Experimentation Can Accelerate Materials Design\nMaterials discovery\, optimization\, and design is one of the major challenges facing civilization in the XXI century. This problem is equivalent to search in the extremely high dimensional chemical space\, the task for which the machine learning and artificial intelligence methods are uniquely suited. However\, unlike typical ML problems\, this space is essentially non-differentiable\, the cost functions are not always accessible due to lack of forward theories\, and practically we seek outliers more then average behaviors. Hence\, the potential of the classical correlative machine learning tools is limited. It can be argued that the presence of parsimonious physical mechanisms can allow effective navigation and extrapolation in chemical space. In this talk\, I will present the new opportunities enabled by physics-informed big data and machine learning technologies to extract physical information from static and dynamic STEM images. I will further illustrate how this data can be used to develop correlative models for solid structures on the atomic level\, and further elucidate generative physics. These approaches allow to recover effective pairwise and many body interactions directly from imaging data. Synergy of deep learning image analytics and real-time feedback further allows harnessing beam-induced atomic and bond dynamics to enable direct atom-by-atom fabrication. Examples of direct atomic motion over mesoscopic distances\, engineered doping at selected lattice site\, and assembly of multiatomic structures will be demonstrated. Finally\, I will share initial results on implementation of image-based feedback on SPM and STEM platforms\, opening the pathway for automated experimentation with microscopy. These advances position STEM and SPM towards transition from purely imaging tool for atomic-scale laboratory of electronic\, phonon\, and quantum phenomena in mesoscale and atomically-engineered structures. \nBiography\nSergei Kalinin is the director of the Institute for Functional Imaging of Materials (IFIM) and distinguished staff member at the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory. He received his MS degree from Moscow State University in 1998 and Ph.D. from the University of Pennsylvania (with Dawn Bonnell) in 2002. \nHis research presently focuses on the applications of big data and artificial intelligence methods in atomically resolved imaging by scanning transmission electron microscopy and scanning probes\, as well as mesoscopic studies of electromechanical and transport phenomena via scanning probe microscopy. \nSergei has co-authored >600 publications\, with a total citation of >30\,000 and an h-index of >85. He is a fellow of MRS\, APS\, IoP\, IEEE\, Foresight Institute\, and AVS; a recipient of the RMS medal for Scanning Probe Microscopy (2015); Blavatnik Award for Physical Sciences (2018)\, Presidential Early Career Award for Scientists and Engineers (PECASE) (2009); Burton medal of Microscopy Society of America (2010); 4 R&D100 Awards (2008\, 2010\, 2016\, and 2018); and a number of other distinctions.
URL:https://aif.ncsu.edu/event/kalinin/
LOCATION:911 Partners Way\, 911 Partners Way\, Engineering Building I room 1011\, Raleigh\, NC\, 27695\, United States
CATEGORIES:2019,NC State,Seminar
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20191122T080000
DTEND;TZID=America/New_York:20191122T170000
DTSTAMP:20191015T183734Z
CREATED:20191015T183734Z
LAST-MODIFIED:20191015T183734Z
UID:10000547-1574409600-1574442000@aif.ncsu.edu
SUMMARY:FIB Short Course
DESCRIPTION:The FIB short course includes lectures covering an introduction to the FIB technique\, an overview of the principles and operation of the FIB\, as well as applications such as FIB prepared SEM and TEM cross section. Also\, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB\, the course will be limited to 4 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/fib-short-course-7/
LOCATION:119 Monteith Research Center\, 2410 Campus Shore Drive\, MRC room 119\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2019,AIF,FIB,Short Course
ORGANIZER;CN="Roberto Garcia":MAILTO:rgarcia@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20200114T090000
DTEND;TZID=America/New_York:20200114T110000
DTSTAMP:20191203T160054Z
CREATED:20191203T143727Z
LAST-MODIFIED:20191203T160054Z
UID:10000478-1578992400-1578999600@aif.ncsu.edu
SUMMARY:Single-Particle Cryo-TEM Workflow at the Convergence of Materials and Life Sciences
DESCRIPTION:This meeting will emphasize cryo-TEM workflow that can be applied to both life and materials sciences. Specifically\, we are looking for your input and involvement to develop future hands on workshops for the processing of Cryo-EM samples at the AIF\, especially workflows on samples consisting of plant and animal matter. \n 
URL:https://aif.ncsu.edu/event/single-particle-cryo-tem-workflow-at-the-convergence-of-materials-and-life-sciences/
LOCATION:463 Monteith Research Center\, 2410 Campus Shore Drive\, Room 463\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2020,AIF
ORGANIZER;CN="Aaron Bell":MAILTO:ajbell6@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20200117T090000
DTEND;TZID=America/New_York:20200117T170000
DTSTAMP:20191203T142552Z
CREATED:20191202T202707Z
LAST-MODIFIED:20191203T142552Z
UID:10000476-1579251600-1579280400@aif.ncsu.edu
SUMMARY:Vacuum Technology Short Course
DESCRIPTION:The Vacuum Technology short course covers the vacuum pumps\, gauges\, fittings\, and other equipment commonly found in vacuum systems. Students will learn how to operate and make changes to a working system. Copies of the slides used in the course will be provided to each student. To provide each student with the opportunity to use the vacuum instrumentation\, the course is limited to four students. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/vacuum-technology-short-course-5/
LOCATION:303F Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 303F\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2020,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20200117T100000
DTEND;TZID=America/New_York:20200117T150000
DTSTAMP:20191204T123735Z
CREATED:20191203T195009Z
LAST-MODIFIED:20191204T123735Z
UID:10000480-1579255200-1579273200@aif.ncsu.edu
SUMMARY:Rietveld Analysis Tutorial
DESCRIPTION:Rietveld refinement\, a whole pattern fitting refinement technique\, is one of the most important methods for structural analysis of crystalline materials. This Rietveld refinement workshop introduces the basic theory of X-ray diffraction (XRD) and factors that would affect an XRD pattern. Also\, a 2-hour hands-on session will be including in this workshop! During the hands-on session\, we will demonstrate how to use GSAS-II software for performing Rietveld analysis. \nPlease email Dr. BB Chung at cchung4@ncsu.edu if you’d like to sign up. This tutorial is free.  \n 
URL:https://aif.ncsu.edu/event/rietveld-analysis-tutorial/
LOCATION:454 Monteith Research Center\, 2410 Campus Shore Drive\, Room 454\, Monteith Research Center (MRC)\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2020,AIF,Tutorial
ORGANIZER;CN="Ching-Chang (BB) Chung":MAILTO:cchung4@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20200124T090000
DTEND;TZID=America/New_York:20200124T170000
DTSTAMP:20191202T202736Z
CREATED:20191202T202433Z
LAST-MODIFIED:20191202T202736Z
UID:10000475-1579856400-1579885200@aif.ncsu.edu
SUMMARY:FIB Short Course
DESCRIPTION:The FIB short course includes lectures covering an introduction to the FIB technique\, an overview of the principles and operation of the FIB\, as well as applications such as FIB prepared SEM and TEM cross section. Also\, there will be hands-on demonstrations of these applications on the AIF Quanta Dual Beam FIB-SEM. To ensure that each student receives maximum time on the FIB\, the course will be limited to 4 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/fib-short-course-8/
LOCATION:119 Monteith Research Center\, 2410 Campus Shore Drive\, MRC room 119\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2020,AIF,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20200131T080000
DTEND;TZID=America/New_York:20200131T170000
DTSTAMP:20191213T185555Z
CREATED:20191213T185555Z
LAST-MODIFIED:20191213T185555Z
UID:10000481-1580457600-1580490000@aif.ncsu.edu
SUMMARY:Surface Analysis (XPS and ToF-SIMS) Short Course
DESCRIPTION:NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in surface analysis of both soft and hard materials. The course will include 1 hour theory component of XPS and ToF-SIMS each in the morning and in the afternoon\, respectively and 1.5 – 2 hour demonstration and hand-on of each instrument right after the lecture. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/surface-analysis-xps-and-tof-sims-short-course-4/
LOCATION:320 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 320\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2020,AIF,Short Course
ORGANIZER;CN="Elaine Zhou":MAILTO:czhou@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20200204T120000
DTEND;TZID=America/New_York:20200204T130000
DTSTAMP:20200204T165308Z
CREATED:20200109T163327Z
LAST-MODIFIED:20200204T165308Z
UID:10000485-1580817600-1580821200@aif.ncsu.edu
SUMMARY:ACerS Carolinas Section Free Webinar
DESCRIPTION:Zoom Link\n\n\n\n\n\n\n  \nRegister Here\n\n\n\n\n\n\n  \nThe newly formed Carolinas Section of the American Ceramic Society is hosting a free webinar on February 4 from 12 PM to 1 PM that highlights Electronic Ceramics in the Carolinas. A flyer with information is below and anyone (including ACERS non-members) can register for the event at the link above to obtain the Zoom connection information. The webinar will feature high-level\, overview presentations by:\n* Veronica Augustyn\, NC State\, Raleigh\, NC\n* Craig Nies\, AVS Corporation\, Fountain Inn\, SC \n \n 
URL:https://aif.ncsu.edu/event/acers-carolinas-section-free-webinar/
CATEGORIES:2020
ORGANIZER;CN="Jacob Jones":MAILTO:jacobjones@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20200207T093000
DTEND;TZID=America/New_York:20200207T170000
DTSTAMP:20200122T143018Z
CREATED:20200122T143018Z
LAST-MODIFIED:20200122T143018Z
UID:10000555-1581067800-1581094800@aif.ncsu.edu
SUMMARY:Confocal Raman Spectroscopy Short Course
DESCRIPTION:  \nThe Confocal Raman short course includes lectures covering an introduction to the Raman spectrometry and Confocal Raman spectroscopy technique\, an overview of the principles and operation of the Raman\, as well as applications such as Raman on liquid and solids. Also\, there will be hands-on demonstrations of these applications on the Horiba Xplora Confocal Raman. To ensure each student receives a maximum amount of time on the Raman\, the course will be limited to 4 participants. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/confocal-raman-spectroscopy-short-course-2/
LOCATION:320 Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 320\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2020,AIF,Short Course
ORGANIZER;CN="Elaine Zhou":MAILTO:czhou@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20200221T080000
DTEND;TZID=America/New_York:20200221T170000
DTSTAMP:20200123T160930Z
CREATED:20200123T160930Z
LAST-MODIFIED:20200123T160930Z
UID:10000556-1582272000-1582304400@aif.ncsu.edu
SUMMARY:Vacuum Technology Short Course
DESCRIPTION:The Vacuum Technology short course covers the vacuum pumps\, gauges\, fittings\, and other equipment commonly found in vacuum systems. Students will learn how to operate and make changes to a working system. Copies of the slides used in the course will be provided to each student. To provide each student with the opportunity to use the vacuum instrumentation\, the course is limited to four students. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/vacuum-technology-short-course-6/
LOCATION:303F Monteith Research Center\, 2410 Campus Shore Drive\, Monteith Research Center\, Room 303F\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2020,Short Course
ORGANIZER;CN="Fred Stevie":MAILTO:fred_stevie@ncsu.edu
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20200302T083000
DTEND;TZID=America/New_York:20200303T173000
DTSTAMP:20191230T153828Z
CREATED:20191230T153701Z
LAST-MODIFIED:20191230T153828Z
UID:10000483-1583137800-1583256600@aif.ncsu.edu
SUMMARY:In Situ Microscopy Congress
DESCRIPTION:During this exciting two day workshop\, you will have the opportunity to learn about in situ and discuss liquid and gaseous experiments with some of the world’s leading researchers. Featuring latest and greatest in situ solutions offered by Protochips and Thermo Fisher Scientific\, numerous talks and demonstrations will show you how in situ techniques can accelerate your research\, allowing you to discover more and publish faster. \nOnce registered\, authors will have the option of submitting an abstract to be considered for an oral or poster presentation. \n  \nMonday\, March 2nd\n8:30-9:00 Registration and check-in \n9:00-9:15 Opening remarks from AIF\, Thermo Fisher Scientific\, and Protochips \n9:15–12:00 Technical Session: In Situ Gas Cell TEM/STEM \n-Plenary Speaker: Xiaoqing Pan\, University of California\, Irvine \n-This symposium will showcase new results and applications for environmental TEM techniques\, as well as cover new equipment capabilities and in situ techniques related to the field. \n12:00-1:00 Lunch – provided \n1:00-4:00 Technical Session: In Situ Liquid Cell TEM/STEM \n-Plenary Speaker: Haimei Zheng\, Lawrence Berkeley National Lab \n-This symposium will highlight many aspects of LCTEM\, from cutting-edge results and future research directions to new techniques and improved equipment designs. \n4:00-5:30 Poster Session and Cocktail Hour \n  \nTuesday\, March 3rd\n9:30-11:00 Introductory Presentations by Thermo Fisher Scientific and Protochips \n11:00-12:15 Coffee Break and Panel Discussion on In Situ TEM/STEM \n12:15-1:15 Lunch – provided \n1:15-2:45 Hands-on Product Demonstrations: \n-Imaging liquid samples using the aberration corrected Titan 80-300 STEM \n-Studying catalysts in atmospheric environments with the Talos F200X G2 TEM/STEM \n-Capabilities and Applications using Focused Ion Beam (FIB) techniques \n2:45-3:15 Coffee Break and Transition \n3:15-4:45 Hands-on Product Demonstrations: \n-Imaging liquid samples using the aberration corrected Titan 80-300 STEM \n-Studying catalysts in atmospheric environments with the Talos F200X G2 TEM/STEM \n-Capabilities and Applications using Focused Ion Beam (FIB) techniques \n4:45-5:00 Wrap Up & Conclusions \n*schedule is approximate and speakers will be announced as confirmed \n\n  \nRegister Here\n\n\n\n\n\n\n  \nSee full flyer here.\n 
URL:https://aif.ncsu.edu/event/in-situ-microscopy-congress/
LOCATION:Hunt Library\, 1070 Partners Way\, Duke Energy Hall (2nd Floor)\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2020,AIF
ORGANIZER;CN="Anna Lumpkin":MAILTO:arlumpkin@ncsu.edu
END:VEVENT
END:VCALENDAR