BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Analytical Instrumentation Facility - ECPv6.16.5//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:Analytical Instrumentation Facility
X-ORIGINAL-URL:https://aif.ncsu.edu
X-WR-CALDESC:Events for Analytical Instrumentation Facility
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:America/New_York
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20170312T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20171105T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20180311T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20181104T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20190310T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20191103T060000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20180810T080000
DTEND;TZID=America/New_York:20180810T170000
DTSTAMP:20180723T185423Z
CREATED:20180723T185423Z
LAST-MODIFIED:20180723T185423Z
UID:5637-1533888000-1533920400@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory\, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging\, the data that can be derived thereof\, and to understand what the generated data means.  This should allow a student who successfully completes the course to operate any SEM with minimal training. By the end of the day\, the students should be able to operate the VPSEM without assistance. To ensure each student receives maximum hands-on time\, the course will be limited to 3 participants. \nFor more details and to register\, please contact Chuck Mooney at cbmooney@ncsu.edu. If there is enough demand\, additional course dates can be added. \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/sem-short-course-august-2018/
LOCATION:318 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,SEM,Short Course
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
GEO:35.7694934;-78.6790169
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=318 Monteith Research Center 2410 Campus Shore Drive Raleigh NC 27606 United States;X-APPLE-RADIUS=500;X-TITLE=2410 Campus Shore Drive:geo:-78.6790169,35.7694934
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20180921T080000
DTEND;TZID=America/New_York:20180921T170000
DTSTAMP:20180824T163102Z
CREATED:20180824T162934Z
LAST-MODIFIED:20180824T163102Z
UID:5962-1537516800-1537549200@aif.ncsu.edu
SUMMARY:SEM Short Course
DESCRIPTION:The goal for the day is to learn the basics of SEM theory and SEM operation so that you can apply that knowledge to analyzing your own samples and/or understanding what SEM data means. Please note that a short course is designed to teach you how the technique works\, the data that can be derived thereof\, and what the generated data means. Training is designed to teach you the operational specifics of a particular instrument. Assuming that all is well you should be able to drive the Hitachi S-3200N SEM more or less independently by the end of the day. That said\, it is not unusual for users to request additional training for a particular instrument. \nWe will start with an introduction lecture to SEM after which we will move to the lab. In the first lab\, the student will observe a demonstration of SEM operation.  Then each of you will drive the microscope on a standard sample and we will explore changing instrument conditions and the resulting effect on the data. During this phase\, we will also learn how to focus and correct astigmatism as well as how to properly set signal gain (contrast) and offset (brightness). After a break for lunch\, there will be another lecture where we learn more about electron beam-sample interactions\, detectors\, how to pick imaging conditions\, etc. Then we will go to the lab where you can apply what you have learned by imaging any sample you wish. You are welcome to bring a sample for this time or I can find one that is appropriate. \nYou should bring something to write with and on\, a memory stick for the presentation and any data or other information that is electronic\, and last but certainly not least\, your brain. You can also bring a sample for hands-on time in the afternoon. We will take a short break for lunch\, probably on the order of 30-45 minutes\, so it might be smart to bring lunch with you. \nThis should be a relaxed and enjoyable day where you learn something fun and useful. Questions? Please contact Chuck Mooney at cbmooney@ncsu.edu. To maximize hands-on time\, the class is limited to three students. \nClick here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course” and type in VPSEM.\n\n\n\n\n\n\n  \n*Industry cost: $350
URL:https://aif.ncsu.edu/event/sem-short-course-sept-21/
LOCATION:324 Monteith Research Center\, 2410 Campus Shore Drive\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,NC State,SEM,Short Course
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/08/66-e1535128077648.jpg
ORGANIZER;CN="Chuck Mooney":MAILTO:cbmooney@ncsu.edu
GEO:35.7694934;-78.6790169
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=324 Monteith Research Center 2410 Campus Shore Drive Raleigh NC 27606 United States;X-APPLE-RADIUS=500;X-TITLE=2410 Campus Shore Drive:geo:-78.6790169,35.7694934
END:VEVENT
END:VCALENDAR