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X-WR-CALNAME:Analytical Instrumentation Facility
X-ORIGINAL-URL:https://aif.ncsu.edu
X-WR-CALDESC:Events for Analytical Instrumentation Facility
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DTSTART;TZID=America/New_York:20181005T090000
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DTSTAMP:20180827T193332Z
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UID:5974-1538730000-1538758800@aif.ncsu.edu
SUMMARY:TEM Short Course
DESCRIPTION:NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques\, which are very powerful to understand the morphology\, structure\, defects\, crystal orientation and phase information of materials\, as well as the chemical distribution down to atomic resolution. It is meant for new TEM users with an interdisciplinary background and/or those interested in learning advanced characterization techniques. The course will include 1.5 hours of theory component (9:00am to 11:00am) and the rest of the day will be in laboratories. \nThis introductory course will cover the following topics: \n\nBasic principles of TEM\nBasic diffraction and imaging\nIntroduction of advanced characterization techniques\n\nAfter completion of this course\, the attendee will be able to gain theory and practical knowledge on how to do basic imaging and diffraction within TEM\, what information the advanced TEM techniques can provide\, as well as how to design their own experiments for their projects. \nFor more details and to register\, add yourself to the short course through Mendix. Click here to watch a short video on how to register for a short course in Mendix. Select “Sign up for a Short Course.” \nIndustry: $350
URL:https://aif.ncsu.edu/event/tem-short-course/
LOCATION:1046 Engineering Building I\, 911 Partners Way\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF,NC State,Short Course,TEM
ATTACH;FMTTYPE=image/jpeg:https://aif.ncsu.edu/wp-content/uploads/sites/31/2018/08/Capture-e1535398403493.jpg
ORGANIZER;CN="Yang Liu":MAILTO:yliu78@ncsu.edu
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DTSTART;TZID=America/New_York:20181130T150000
DTEND;TZID=America/New_York:20181130T160000
DTSTAMP:20181121T162102Z
CREATED:20181121T161845Z
LAST-MODIFIED:20181121T162102Z
UID:6312-1543590000-1543593600@aif.ncsu.edu
SUMMARY:TEM User Meeting
DESCRIPTION:AIF has seen many recent changes in the TEM labs and a few more changes will roll-out soon. To stay updated with how these important changes will affect your access to\, and operation of\, the TEM instruments and sample preparation lab\, Jacob Jones (Director of AIF) is hosting an all-hands TEM user meeting on Friday\, Nov 30\, at 3 PM in EB1 room 1005. If you are a currently trained operator of a TEM instrument in AIF\, your attendance is needed at this meeting. For users that cannot attend\, you may be asked to meet individually with a staff member afterwards to assess your situation.\n\nThanks and we look forward to your continued success in our lab and participation in a vibrant analytical facility.
URL:https://aif.ncsu.edu/event/tem-user-meeting/
LOCATION:1005 Engineering Building I\, 911 Partners Way\, Engineering Building I\, room 1005\, Raleigh\, NC\, 27606\, United States
CATEGORIES:2018,AIF
ORGANIZER;CN="Jacob Jones":MAILTO:jacobjones@ncsu.edu
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