Scios Dual Beam Focused Ion Beam

The Scios is a Ga Liquid Metal Ion Source (LMIS) instrument for TEM sample prep, patterning, and SEM cross sectioning of samples. This is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system that provides outstanding sample preparation and 3D characterization performance for a wide range of samples, including magnetic and non-conductive materials. 

Questions? Contact Roberto Garcia at rgarcia@ncsu.edu. 
Location: MRC 119

Equipment Specifications