SEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on Scanning Electron Microscopy (SEM). There will be two hours of lecture and each student will gain an hour of hands-on time running a Field Emission SEM FEI Verois 460L .  The goal of the course is to provide students with enough theory and practical knowledge that they are operating the FESEM without any assistance by the end of the day. To insure each student receives a maximum of time on the SEM, the course will be limited to 6 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu.