Other Techniques

Surface analysis techniques involve the use of microscopic chemical and physical probes to give information about the surface region of a sample. The probed region may be the uppermost layer of atoms, or extend to several microns beneath the sample surface, depending on the technique used. The analysis is done to provide information about the chemical composition, the level of trace impurities, or the physical structure or appearance of the sampled region. In addition to ToF-SIMS and XPS, AIF provides Atomic Force Microscope (AFM), Confocal Laser Scanning Microscope (CLSM), Confocal Raman Microscope and Nanoindentation.