Techniques at a Glance
The AIF hosts a wide range of state of the art material characterization tools ranging from electron microscopy to X-ray diffraction to surface chemical analysis. These tools are capable of solving a wide range of problems, from failure analysis to corrosion and contamination identification, to answering the unknown, like structural identification and purity evaluation.
| Characterization Method | Equipment | Lab Manager |
|---|---|---|
| Scanning Electron Microscopy (SEM) | Hitachi SU8700 Hitachi SU3900 | Chuck Mooney Toby Tung |
| X-ray Diffraction (XRD) | Rigaku SmartLab PANalytical Empyrean PANalytical X’Pert Pro | Jenny Forrester |
| Transmission Electron Microscopy (TEM) | Thermo Fisher Talos F200X Thermo Fisher Titan 80-300 | Chris Winkler |
| Focus Ion Beam (FIB) | Helios Hydra G5 Scios Dual Beam | Roberto Garcia |
| Biological Electron Microscopy (Bio EM) | Leica ACE900 Freeze Fracture Leica EM AFS2 Freeze Substitution Bio-TEM model HT7800 | Aaron Bell Jin Nakashima |
| X-ray Photoelectron Spectroscopy (XPS) | SPECS | Sameera Pathiranage |
| Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) | ION TOF ToF-SIMS5 | Chuanzhen “Elaine” Zhou |
| X-ray Tomography (CT) | ZEISS Xradia 510 Versa | Ruksana Baby |
| Nanoindentation | Bruker Hysitron TI980 Triboindenter | Toby Tung |
| Confocal Laser Scanning Microscopy (CLSM) | Keyence VKx1100 | Toby Tung |
| Confocal Raman Microscope (CRM) | Horiba XploRA PLUS | Chuanzhen “Elaine” Zhou |
| Atomic Force Microscope (AFM) | Asylum MFP-3D | Chuck Mooney |