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Sameera Pathiranage

SP

Surface Analysis Postdoctoral Researcher

Monteith Research Center (MRC), Room 246

919-513-0545 Website

Bio

Dr. Sameera Pathiranage earned his Ph.D. in Physics (2022) from University of North Dakota. He was born and raised in Sri Lanka and received his BSc. degree from University of Peradeniya in 2016. He joined the Analytical Instrumentation Facility (AIF) as a postdoctoral researcher in August 2022. At AIF, Sameera is responsible for service, maintenance, development, and training for various surface analytical techniques including but not limited to XPS, ToF-SIMS and Confocal Raman Microscope. He is a member of American Physics Society (APS).