X-Ray Photoelectron Spectroscopy (XPS)
X-Ray Photoelectron Spectroscopy (XPS) is a surface analysis technique that can provide elemental and chemical bonding information from the very top surface of a specimen.
Location: MRC room 320
The specimen of the top of surfaces is bombarded with X-Rays and emitted electrons are energy analyzed. Most of the signal arises from the first few monolayers. Elemental characterization of the surface can be achieved with about 0.1% detection limit and chemical bonding information can be obtained from differences in binding energy. The cleanliness of the sample and the storage container is very important.
Equipment Specifications
Sources
- Al/Mg dual anode
- Al/Ag dual anode monochromator
- UV (helium)
Capabilities
- Ar ion gun for sputter cleaning of surface (up to 5kV)
- Six channeltron array detector and spin detector
- Specimen heating and cooling
- Electron flood gun for charge neutralization (1μA emission at 2.5V)
Specimen Requirements
- Ultra high vacuum compatible
- Store in Fluroware, glass, or Al foil
- Specimen size 1cm x 1cm
- Powders can be analyzed
- X-Ray Energy
- 10-14kV for Al/Mg and Al/Ag sources
- Analyzer
- PHOIBOS 150, <1eV resolution
- Data Output
- CasaXPS or Excel
Contact Us
Surface Analysis Postdoctoral Researcher – Sameera Pathiranage
smpathir@ncsu.edu
Office Phone Number
919-513-0545