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Atomic Force Microscope (AFM)

Atomic force microscopy involves using a cantilever with a nanometer-scale tip to scan the specimen surface for local structure and properties.

Location: MRC room 307

The Asylum MFP-3D classic Atomic Force Microscope (AFM) comes with a variety of advanced capabilities, including variable magnetic field module for in- and out-of-plane measurements, a probe station adapter for concurrent 2- and 3-point probe electrical measurements, viscoelastic mapping mode, conductive AFM, and a closed fluid cell for measurement in gases or liquids. This instrumentation acquisition was enabled by the Office of Research, Innovation and Economic Development (ORIED).

Contact Us

AFM Lab Manager – Chuck Mooney

cbmooney@ncsu.edu

Office Phone Number

919-515-2348