SEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on Scanning Electron Microscopy (SEM). There will be lectures on SEM theory and each student will get hands-on time running the AIF’s variable pressure SEM (VPSEM).  The goal of the course is to provide students a basic understanding of both theory and practice that they can operate any SEM with minimal training.  By the end of the day, the students will be able to operate the VPSEM without any assistance. To insure each student receives maximum hands-on time, the course will be limited to 4 participants.

For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu.