May 28th, 2015 – XRD Specialized Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a XRD short course specialized in advanced X-ray analysis methods using Eulerian Cradle, and in situ XRD measurements using non-ambient stages. These advanced characterization techniques are very useful to investigate thin film/crystal quality, orientation relation between film and substrate, texture, thermal expansion, crystallization reactions, and phase transition studies. The course will include 1.5 hour theory component (taught by Dr. Ching-Chang Chung) on Thursday Morning (9 am to 10:30 am), and the rest of the day will be in the XRD lab.

This short course will cover the following topics:

1. Introduction of different characterization techniques using an Eulerian Cradle. This includes Rocking Curve, Reciprocal Space Mapping, Phi Scan, and Pole Figure measurements.
2. Introduction of in situ XRD measurements using non-ambient stages.
3. Lab Sessions

After completion of this course, the attendee will be able to gain theory and practical knowledge on how to do advanced X-ray analysis methods using an Eulerian Cradle and different non-ambient stages, and how to optimize/design their own experiments for their projects.

For more details and to register, please contact Dr. Ching-Chang Chung at his email cchung4@ncsu.edu

Course limited to 10 people.