Sep 16th, 2016 – CryoSEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Cryogenic Scanning Electron Microscopy (SEM) on a routine basis.  There is a 1.5 hr lecture on CryoSEM theory, application and sample preparation. Each student will get hands-on time (90 minute or more per student) for preparing CryoSEM samples and running the AIF JEOL JSM-7600 SEM.  The goal of the course is to provide students a basic understanding of both theory and practice.  To insure each student receives maximum hands-on time, the course will be limited to 4 participants.