Oct 14th, 2016 – XPS Data Analysis and Peak Fitting Short Course

Per many requests, NCSU’s Analytical Instrumentation Facility (AIF) is giving a short course on X-ray Photoelectron Spectroscopy (XPS) data analysis and peak fitting. The short course will cover demonstration of CASA software, quantification and peak fitting. Attendees will recieve the digital copy of lecture materials.

For more details and to register, please contact Fred Stevie at his email fred_stevie@ncsu.edu.