Energy Filter TEM

NCSU’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition, and data processing/analysis. The second workshop in the Spring of 2017 will be focused on Energy-filtered TEM (EFTEM). The following topics will be covered in this workshop:

1. Fundamentals of EFTEM
2. Practical setup of EFTEM acquisition
3. EFTEM Mapping methods (Jump ratio, 3-window, and Spectrum Imaging)
4. EFTEM data processing/analysis, and multiple linear least squares (MLLS) fitting for mapping overlapped edges

For more details and to register, please contact Dr. Yang Liu at his email yliu78@ncsu.edu. To insure each participant receives a maximum of time, the workshop will be limited to 6 participants.