We Are Hiring! Surface Analysis (XPS and ToF SIMS) Postdoctoral Researcher Opening at AIF
The AIF is hiring! We are seeking a talented and industrious experimentalist to join our team as a Surface Analysis Postdoctoral Researcher. Representative duties include training users on the operation of the XPS, ToF-SIMS, Confocal Raman and assisting with the analysis and interpretation of the data. Individuals will also assist with the maintenance and calibration of the SPECS, ION TOF, and Horiba instruments, and will stay abreast of software and hardware developments by reading current literature and attending relevant technical conferences.
