Jun 5, 2017
SEM Short Course NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory,…
May 3, 2017
FIB short course AIF is going to offer another FIB short course in May 19th, 2017. The FIB short course includes lectures covering an introduction to the FIB technique, an…
Mar 23, 2017
FIB short course AIF is going to offer another FIB short course in March 10th, 2017. The FIB short course includes lectures covering an introduction to the FIB technique, an…
Mar 13, 2017
Jan 27, 2017
Jan 10, 2017
EBSD Workshop This Workshop will be mainly centered around specimen detector geometry and how the software gathers and interprets the data. This will be pertinent to EBSD and TKD data collection.…
FIB short course AIF is going to offer another FIB short course in Jan 20th, 2017. The FIB short course includes lectures covering an introduction to the FIB technique, an…
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