| Nano X-ray Tomography (CT) | Confocal Raman Spectroscopy | Nanoindentation | Liquid Cell (TEM) | Focus Ion Beam (FIB) |
| Scanning Electron Microscope (SEM) | Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) | Nanotribology | Reactive Gas Cell (TEM, XRD) | Cryo-ultramicrotome |
| Transmission Electron Microscope (TEM) | X-ray Photoelectron Spectroscopy (XPS) | Picoindentor | Picoindentor Stage (TEM, SEM) | Cryo-microtome |
| Focus Ion Beam (FIB) | X-ray Diffraction (XRD) | Mechanical Tensile Stage Under SEM | Mechanical Tensile Stage | Ion Mill |
| Confocal Laser Scanning Microscope (CLSM) | Energy Disperse X-ray Spectroscopy (EDS) | Atomic Force Microscope (AFM) | Heating Stage in TEM | TEM Wedge Polishing |
| Atomic Force Microscope (AFM) | Electron Energy Loss Spectroscopy (EELS) | – | Heating/Cooling Stage in XRD, XPS, Raman and ToF SIMS | Backside Polishing for SIMS |
| Grain Orientation (EBSD) | – | – | – | Diamond saw |
| – | – | – | – | Carbon Coater |