AIF at NC State & Asylum Research AFM Workshop
January 24 @ 10:00 am - 4:00 pm
AIF at NC State & Asylum Research AFM Workshop
Practical AC Mode & KPFM Imaging
Workshop Overview
As part of the Carolina Science Symposia, the North Carolina State University Analytical Instrumentation Facility (AIF), in collaboration with the Research Triangle Nanotechnology Network (RTNN) and Oxford Instruments Asylum Research, is excited to host a hands-on Atomic Force Microscope (AFM) workshop.
This in-person event will focus on practical AC (tapping) mode and amplitude-modulated Kelvin Probe Force Microscopy (KPFM) imaging using Asylum Research Atomic Force Microscopes (AFM). Join us at NC State University in the Larry K. Monteith Engineering Research Center to gain valuable insights and practical skills in AFM imaging technology, led by a local expert in the field.
Don’t miss this opportunity to expand your knowledge and expertise in AFM imaging! If you have any questions, please email Anna Lumpkin at arlumpkin@ncsu.edu or Ryan Fuierer at Ryan.Fuierer@oxinst.com.
Details
- When: Friday, January 24, 2025 | 10:00 AM – 4:00 PM EST
- Where: NC State University, Monteith Research Center, room 454
2410 Campus Shore Dr, Raleigh, NC 27606 - Presenter: Ryan Fuierer, PhD (Oxford Instruments Asylum Research)
- Pricing: Free
- Visitor Parking: See the parking options here.
- Lunch will be provided.
Workshop Agenda
Morning Session (10:00 AM – 12:00 PM)
- Technical presentation with discussions, data examples, and operational procedures for collecting AC and KPFM mode images.
- Tips and tricks for reliably capturing high-quality tapping mode images.
- Step-by-step tuning of KPFM parameters for optimal results.
Lunch Break (12:00 PM – 1:00 PM)
Afternoon Session (1:00 PM – 4:00 PM)
- Hands-on training to collect high-quality tapping mode images on KPFM samples.
- Live demonstrations of KPFM parameter tuning protocols.
- In-depth discussion of related topics.
Registration
Complete the Google Form here to secure your spot.