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About Us
About Us
Meet the Team
Contact Us, Parking, & Directions
Techniques at a Glance
AIF’s History & Goals
User Portal
User Portal
Pricing
Schedule an Instrument
Electron Microscopy
Electron Microscopy
Focused Ion Beam
Scanning Electron Microscopy
Transmission Electron Microscopy
X-ray Analysis
X-ray Analysis
X-ray Diffraction
X-ray Fluorescence
X-ray Tomography
Surface Analysis
Surface Analysis
Time-of-Flight SIMS
X-Ray Photoelectron Spectroscopy (XPS)
Other Techniques
Biological Electron Microscopy
Biological Electron Microscopy
Biological Electron Microscopy
Biological Electron Microscopy Brochure
Bio-EM Images
News & Publications
News & Publications
AIF Recent News
YouTube Channel
AIF Events
AIF User Publications
Give Now
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« All Events
This event has passed.
SEM Course: Methods of X-ray detection
June 9, 2020 @ 2:00 pm
-
3:00 pm
Free
«
Introduction to FIB/Live Demonstration
SEM Course: Electron Optics
»
Zoom Information
https://ncsu.zoom.us/s/92209895043
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Details
Date:
June 9, 2020
Time:
2:00 pm - 3:00 pm
Cost:
Free
Event Categories:
2020
,
AIF
,
SEM
Organizer
Chuck Mooney
Phone
919-515-2348
Email
cbmooney@ncsu.edu
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