The Analytical Instrumentation Facility is now offering a virtual short course on scanning electron microscopy (SEM). In addition to two lectures on practical SEM operation there will be a live (virtual) demonstration of the operation of a conventional thermal emitter SEM that will show how changing beam parameters affects the resulting data. The goal of the course is to provide students a basic knowledge of both the theory and practice of SEM imaging, the data that can be derived thereof, and to understand what the generated data means. This course counts toward one of the three training sessions that are required for hands-on use of the AIF Hitachi S-3200N VPSEM. Since the course is virtual, there is no limit to the number of registrants. For more details and to register, please contact Chuck Mooney at cbmooney@ncsu.edu.