Continue to discover how AFM can quantify nanomechanical properties to further benefit your research. In Part 2 of our 3 part series, we’ll discuss the following topics: In-liquid Imaging Force Spectroscopy Nanomechanics on soft materials For more details and to register, please contact Ryan Fuierer at [email protected] or Chuck Mooney at [email protected] or visit the website here.
We offer a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory, each student will get hands-on time running the AIF variable pressure SEM (VPSEM). The goal of the course is to provide students a basic knowledge of both the theory and practice of…
Please join us for our annual Open House & User Appreciation. During this time, we'll have an introduction for new users (presented by Dr. Ching-Chang (BB) Chung), AIF tours for new and existing users, and an ice cream social featuring NC State's Howling Cow ice cream. Although the event is free, please make sure to…
NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in…
