NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles of surface analysis and the two commonly used techniques XPS and ToF-SIMS including theory and applications. It is meant for those who are interested in…