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PANalytical X’Pert Pro X-ray Diffractometer

The PANalytical X'Pert diffractometer has user-friendly features and is capable of fast data collection with a low background.

Location: MRC room 303C

Fast data collection with a reasonable background is possible because of the combination of the X’Celerator detector and Ni filter. For room temperature XRD patterns, there is no height alignment, a parameter file is loaded, and the XRD pattern is recorded. Training and subsequent usage are straightforward. The 1600°C furnace with a platinum heating strip allows in situ XRD to be undertaken in air, vacuum, or flowing inert gases. The spinner stage and flat stages allow a variety of sample shapes and forms to be measured. The transmission spinner can allow enhanced measurements of organic compounds and samples with texture issues.

Equipment Specifications

  • Detector: X’Celerator with Ni filter
  • No height alignment required for room temperature XRD patterns
  • Stages
    • Flat Stage
    • Spinner Stage: allows for a variety of sample shapes and forms
    • Transmission spinner stage: allows for enhanced measurements of organic compounds and samples with texture
    • 1600℃ furnace with platinum heating strip: allows for in situ XRD patterns to be measured in air, vacuum, or flowing inert gases
  • Voltage: 45 kV max. operating voltage
  • Current: 40 mA max. operating current
  • Line and spot focus
  • Beam masks: 5, 10, 15, 20 mm
  • Programmable divergence slit
  • Automatic: 0.5 to 20 mm
  • Fixed: 1/32° to 4°
  • Anti-scatter slits: 1/32 to 4°
  • Soller Slits: 0.04 rad
  • Programmable divergence slit: 1/32° to 2°
  • Soller slits: 0.04 rad
  • Bragg-Brentano in reflection or transmission geometry with sample spinning option
  • X’Celerator with fixed anti-scatter slit
  • Proportional detector
  • Parallel beam X-ray mirror for Cu radiation
  • Hybrid monochromator 2-bounce Ge(220)
  • Spinner Stage
  • Flat Stage     
  • Transmission Spinner Stage
  • HTK-16: Ambient to 1600°C; Air, N, Ar, Vacuum