Rigaku SmartLab X-ray Diffractometer
The Rigaku SmartLab X-ray diffractometer has options for a wide variety of high resolution, low background XRD patterns. Optics capabilities include Bragg Brentano, grazing incidence and X-ray reflectivity (XRR) for thin films, and we have a Eulerian cradle for orientational studies.
Location: MRC room 303C
The Rigaku XRD has a range of optics that can be used to collect:
- High resolution XRD patterns with low background in Bragg Brentano set-up
- Grazing incidence XRD patterns from thin films
- X-ray reflectivity (XRR) patterns
- High-resolution with a Ge (220 x2) double bounce monochromator for thin film quality studies
- Eulerian cradle for orientation studies of thin films and single crystals
Equipment Specifications
Sealed Tube Generator
- Voltage: 20 – 40kV max. operating voltage
- Current: 2 – 44mA max. operating current
Cu X-ray Tube
- Line Focus
- Focal Spot: 0.4 mm x 12.0 mm
Parallel Beam Optics
- Laterally graded incident beam multilayer x-ray mirror
- Automated mirror control and alignment
- Variable incident slit: 0.05 – 7.0 mm
- Height limiting slit: 2.0 – 10.0 mm
- Ge(220) x 2 monochromator
Bragg-Brentano Optics
- Variable incident slit: 0.05 – 7.0 mm
- Height limiting slit: 2.0 – 10.0 mm
- Soller Slits: 5o axial divergence
Diffracted Beam Optics
- Computer controlled receiving slits (x2): 0.05 mm – 20 mm
- Parallel Slit Analyzer: 5o angular divergence
- Kβ filter
- Graphite monochromator: curved or flat
Sample Stages
- Standard single specimen stage
- Eulerian cradle with φ and χ rotation for texture, reflectivity, and residual stress measurement
Operating Mode
- Bragg-Brentano in reflection geometry
- Grazing incidence X-ray diffraction (GIXRD)
- X-ray reflectivity (XRR)
- Rocking curve
- Phi scan
- Reciprocal space mapping
- Pole figure