May 28, 2016
SEM Short Course NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis. In addition to two lectures on SEM theory,…
May 27, 2016
FIB short course AIF is going to offer another FIB short course in June 26th, 2015. The FIB short course includes lectures covering an introduction to the FIB technique, an…
Mar 29, 2016
Feb 26, 2016
Feb 17, 2016
Feb 11, 2016
Nanoindentation Short Course This introductory short course will cover the basic principles and operation of nanomechanical testing through quasistatic nanoindentation. The lecture component will introduce the concepts of deformation…
Dec 16, 2015
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