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Analytical Instrumentation Facility

Recent News

Mar 23, 2017

Apr 10th 2017 – Lunch and Learn: SMIF and CHNAL Present Unique Capabilities

Come learn about unique capabilities that could aid in your research! Over lunch, Dr. Carrie Donley (director of the Chapel Hill Analytical and Nanofabrication Laboratory, CHANL) and Dr. Mark Walters…

Mar 23, 2017

Apr 7th 2017 – Basic Vacuum Technology Short Course

  Date Friday, April 7th, 2017 Time  8:30 am – 5:00 pm Location Monteith Research Center, Rm 320 (NCSU Centennial Campus) Instructor Fred Stevie Registration Cost NCSU student $50; non-profit…

Mar 14, 2017

Mar 31th, 2017 – Special topic in TEM: EFTEM Workshop

Energy Filter TEM NCSU’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition, and data…

Mar 13, 2017

March 24th, 2017 – SEM Short Course

SEM Short Course NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory,…

Jan 27, 2017

Mar 10th, 2017 – FIB Short Course

FIB short course AIF is going to offer another FIB short course in March 10th, 2017. The FIB short course includes lectures covering an introduction to the FIB technique, an…

Jan 27, 2017

Mar 3rdth, 2017 – special topic in TEM: EELS workshop

EELS Workshop Short Course   NCSU’s Analytical Instrumentation Facility (AIF) is giving a series of courses/workshops on various techniques in electron microscopy, which will focus on fundamental principles, data acquisition,…

Jan 27, 2017

Mar 3rd 2017 – Basic Vacuum Technology Short Course

  Date Friday, March 3rd, 2017 Time  8:30 am – 5:00 pm Location Monteith Research Center, Rm 320 (NCSU Centennial Campus) Instructor Fred Stevie Registration Cost NCSU student $50; non-profit…

Jan 27, 2017

Feb 24th, 2017 – SEM Short Course

SEM Short Course NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory,…

Jan 15, 2017

Feb 17th, 2017 – XPS and ToF-SIMS Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles…

Jan 10, 2017

Jan 27th, 2017 – EBSD Workshop

EBSD Workshop This Workshop will be mainly centered around specimen detector geometry and how the software gathers and interprets the data. This will be pertinent to EBSD and TKD data collection.…