Techniques at a Glance
The AIF hosts a wide range of state of the art material characterization tools ranging from electron microscopy to X-ray diffraction to surface chemical analysis. These tools are capable of solving a wide range of problems, from failure analysis to corrosion and contamination identification, to answering the unknown, like structural identification and purity evaluation.
| Characterization Method | Equipment | Lab Manager |
|---|---|---|
| Scanning Electron Microscopy (SEM) | Hitachi SU8700 Hitachi SU3900 | Chuck Mooney Toby Tung |
| X-ray Diffraction (XRD) | Rigaku SmartLab PANalytical Empyrean PANalytical X’Pert Pro | Jenny Forrester |
| Transmission Electron Microscopy (TEM) | Thermo Fisher Talos F200X Thermo Fisher Titan 80-300 | Chris Winkler |
| Focus Ion Beam (FIB) | Helios Hydra G5 Scios Dual Beam | Roberto Garcia |
| Biological Electron Microscopy (Bio EM) | Leica ACE900 Freeze Fracture Leica EM AFS2 Freeze Substitution Bio-TEM model HT7800 | Aaron Bell Jin Nakashima |
| X-ray Photoelectron Spectroscopy (XPS) | SPECS | Sameera Pathiranage |
| Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) | ION TOF ToF-SIMS5 | Chuanzhen “Elaine” Zhou |
| X-ray Tomography (CT) | ZEISS Xradia 510 Versa | Ruksana Baby |
| Nanoindentation | Bruker Hysitron TI980 Triboindenter | Toby Tung |
| Confocal Laser Scanning Microscopy (CLSM) | Keyence VKx1100 | Toby Tung |
| Confocal Raman Microscope (CRM) | Horiba XploRA PLUS | Chuanzhen “Elaine” Zhou |
| Atomic Force Microscope (AFM) | Asylum MFP-3D | Chuck Mooney |
Sample Prep Laboratory
The AIF offers a comprehensive range of instruments for cutting, polishing, and preparing samples for further analysis. These tools are housed in the Sample Preparation area, which requires training and an active agreement for access.
Multiprep
Low Speed Saw
Fume Hood
