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Analytical Instrumentation Facility

Recent News

Oct 7, 2016

Data-Enabled Science and Engineering of Atomic Structure (SEAS)

We are pleased to announce a new data-enabled science and engineering traineeship program for PhD students, sponsored by NSF. The program will train students at the intersection of statistics, big…

Sep 3, 2016

Oct 14th, 2016 – XPS Data Analysis and Peak Fitting Short Course

Per many requests, NCSU’s Analytical Instrumentation Facility (AIF) is giving a short course on X-ray Photoelectron Spectroscopy (XPS) data analysis and peak fitting. The short course will cover demonstration of CASA…

Sep 2, 2016

Oct 9th, 2016 – RTNN Nano Image Contest

National Nanotechnology Day will be held on October 9, 2016. In celebration, RTNN is hosting a nano-themed image contest. The winning image will be highlighted prominently on the RTNN website…

Sep 2, 2016

Sep 30th, 2016 – SEM Short Course

SEM Short Course NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory,…

Sep 1, 2016

Sep 30th, 2016 – XRD Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Diffraction (XRD). This introductory course will cover basic principles of X-ray diffraction, operation of diffractometers in Bragg-Brentano…

Jul 14, 2016

Sep 30th, 2016 – XPS and ToF-SIMS Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS). This introductory course will cover basic principles…

Jul 14, 2016

Sep 23th, 2016 – SEM Short Course

SEM Short Course NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Scanning Electron Microscopy (SEM) on a routine basis.  In addition to two lectures on SEM theory,…

Jul 14, 2016

Sep 23th, 2016 – TEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) is giving a hands-on short course on transmission electron microscopy (TEM) and related techniques, which are very powerful to understand the morphology, structure, defects, crystal…

Jul 14, 2016

Sep 16th, 2016 – CryoSEM Short Course

NCSU’s Analytical Instrumentation Facility (AIF) offers a hands-on short course on Cryogenic Scanning Electron Microscopy (SEM) on a routine basis.  There is a 1.5 hr lecture on CryoSEM theory, application…

Jul 14, 2016

Sep 16th, 2016 – FIB Short Course

FIB short course AIF is going to offer another FIB short course in Sep 16th, 2016. The FIB short course includes lectures covering an introduction to the FIB technique, an…